Invention Grant
- Patent Title: System and method for on-chip resistor calibration in semiconductor devices
- Patent Title (中): 半导体器件片上电阻校准的系统和方法
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Application No.: US12927240Application Date: 2010-11-10
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Publication No.: US08476911B2Publication Date: 2013-07-02
- Inventor: Alireza Zolfaghari , Chin-Ming Chien , Bojko Marholev
- Applicant: Alireza Zolfaghari , Chin-Ming Chien , Bojko Marholev
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agency: Farjami & Farjami LLP
- Main IPC: G01R27/29
- IPC: G01R27/29 ; G01R35/00

Abstract:
According to one disclosed embodiment, an on-chip resistor calibration circuit includes an RC oscillator having a test resistor and a precision capacitor as elements, a counter, and a reference clock. In one embodiment, an RC oscillator generates a waveform having a period dependent upon the resistance of the test resistor and the capacitance of the precision capacitor. In such an embodiment, a counter and a reference clock may be configured to measure the period of the waveform. Using a pre-determined capacitance of the precision capacitor, a resistance of the test resistor may be determined. In another embodiment, an RC oscillator generates first and second waveforms through use of an additional capacitor that can be switched in and out of the RC oscillator circuit. Using a pre-determined capacitance of the precision capacitor, an RC product of the test resistor and the additional capacitor may be determined.
Public/Granted literature
- US20120112773A1 System and method for on-chip resistor calibration in semiconductor devices Public/Granted day:2012-05-10
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