Invention Grant
- Patent Title: Electronic device with power tester
- Patent Title (中): 带电源测试仪的电子设备
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Application No.: US12759979Application Date: 2010-04-14
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Publication No.: US08476907B2Publication Date: 2013-07-02
- Inventor: Gunok Jung , Ukrae Cho , Yongjin Yoon , Donggyu Lee
- Applicant: Gunok Jung , Ukrae Cho , Yongjin Yoon , Donggyu Lee
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2009-0042690 20090515
- Main IPC: G01R31/08
- IPC: G01R31/08

Abstract:
An electronic device includes an internal device and a voltage tester. The internal device includes a power supply source input terminal. The voltage tester supplies one of first and second power supply source voltages to the power supply source input terminal of the internal device, in response to a test signal. The first and second power supply source voltages have different voltage levels. The first power supply source voltage has a voltage level within a normal range required for normal operations of the internal device. The second power supply source voltage has an abnormal voltage level outside the normal range.
Public/Granted literature
- US20100289339A1 ELECTRONIC DEVICE WITH POWER TESTER Public/Granted day:2010-11-18
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