Invention Grant
- Patent Title: Processes and device for the deposition of films on substrates
- Patent Title (中): 用于在基材上沉积膜的方法和装置
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Application No.: US13216979Application Date: 2011-08-24
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Publication No.: US08475635B2Publication Date: 2013-07-02
- Inventor: Andrey E. Yakshin , Wolfgang Fukarek
- Applicant: Andrey E. Yakshin , Wolfgang Fukarek
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss SMT GmbH
- Current Assignee: Carl Zeiss SMT GmbH
- Current Assignee Address: DE Oberkochen
- Agency: Sughrue Mion, PLLC
- Main IPC: C23C14/34
- IPC: C23C14/34

Abstract:
Deposition processes and devices for the fabrication of multilayer systems to better control the energy contribution at different stages of the deposition. This is achieved by depositing films by sputtering in a scheme providing for thermalized particles. Thermalized particles are obtained by choosing the working gas pressure and the distance between target and substrate to result in a mean free path of particles smaller than the distance between target and substrate or to result in a product of pressure and distance being larger than 2.0 cmPa.
Public/Granted literature
- US20110303529A1 PROCESSES AND DEVICE FOR THE DEPOSITION OF FILMS ON SUBSTRATES Public/Granted day:2011-12-15
Information query
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