Invention Grant
- Patent Title: X-ray diagnostic apparatus
- Patent Title (中): X光诊断仪
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Application No.: US12647220Application Date: 2009-12-24
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Publication No.: US08475041B2Publication Date: 2013-07-02
- Inventor: Hisato Takemoto , Ryuji Zaiki , Takuya Sakaguchi
- Applicant: Hisato Takemoto , Ryuji Zaiki , Takuya Sakaguchi
- Applicant Address: JP Tokyo JP Otawara-shi
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee Address: JP Tokyo JP Otawara-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-331045 20081225; JP2009-289138 20091221
- Main IPC: H05G1/02
- IPC: H05G1/02 ; A61B6/00

Abstract:
An X-ray diagnostic apparatus includes imaging means including an X-ray application unit which applies X-rays to a subject and an X-ray detection unit which detects the X-rays applied from the X-ray application unit to pick up a medical image, path calculating means for obtaining a path of an imaging position for the subject on the basis of a map image, a storage unit which stores the path, imaging system moving means for movably supporting the imaging means to capture the imaging position in an imaging field and movement control means for moving the imaging system moving means to successively move the imaging position along the path.
Public/Granted literature
- US20100166152A1 X-RAY DIAGNOSTIC APPARATUS Public/Granted day:2010-07-01
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