Invention Grant
- Patent Title: Manufacturing method of semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US13206042Application Date: 2011-08-09
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Publication No.: US08474126B2Publication Date: 2013-07-02
- Inventor: Takeshi Shioga , Kazuaki Kurihara
- Applicant: Takeshi Shioga , Kazuaki Kurihara
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2007-226592 20070831
- Main IPC: H01S4/00
- IPC: H01S4/00

Abstract:
A manufacturing method of a semiconductor device include forming a capacitor by forming an oxide film on a surface of a valve metal based on anodic oxidization and by forming a conductive part made of a conductive material on the oxide film; adhering the capacitor on a semiconductor element mounted on a supporting substrate; and coupling the capacitor to the supporting substrate via an outside connection terminal.
Public/Granted literature
- US20110294265A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME Public/Granted day:2011-12-01
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