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US08474126B2 Manufacturing method of semiconductor device 有权
半导体器件的制造方法

Manufacturing method of semiconductor device
Abstract:
A manufacturing method of a semiconductor device include forming a capacitor by forming an oxide film on a surface of a valve metal based on anodic oxidization and by forming a conductive part made of a conductive material on the oxide film; adhering the capacitor on a semiconductor element mounted on a supporting substrate; and coupling the capacitor to the supporting substrate via an outside connection terminal.
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