Invention Grant
- Patent Title: Method for testing electronic device
- Patent Title (中): 电子设备测试方法
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Application No.: US12944750Application Date: 2010-11-12
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Publication No.: US08463570B2Publication Date: 2013-06-11
- Inventor: Yu-Long Lin , Hua Dong , Jie-Jun Tan , Yi-Yong Xie
- Applicant: Yu-Long Lin , Hua Dong , Jie-Jun Tan , Yi-Yong Xie
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201010223749 20100714
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A method for testing an electronic device is implemented with a host computer. The host computer detects a test status of the electronic device. The host computer stores a test order table that indicates the test status and test order corresponding to the test status. The host computer transmits a test order based on the test status and the test order table to the electronic device. The electronic device executes a self-test based on the test order.
Public/Granted literature
- US20120016617A1 METHOD FOR TESTING ELECTRONIC DEVICE Public/Granted day:2012-01-19
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