Invention Grant
- Patent Title: Infrared-ray thermal image analyzer
- Patent Title (中): 红外线图像分析仪
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Application No.: US12808923Application Date: 2008-10-21
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Publication No.: US08462990B2Publication Date: 2013-06-11
- Inventor: Yukio Akashi , Kazuaki Hashimoto , Shogo Hayashi
- Applicant: Yukio Akashi , Kazuaki Hashimoto , Shogo Hayashi
- Applicant Address: JP Takamatsu-shi
- Assignee: West Nippon Expressway Engineering Shikoku Company Limited
- Current Assignee: West Nippon Expressway Engineering Shikoku Company Limited
- Current Assignee Address: JP Takamatsu-shi
- Agency: Kratz, Quintos & Hanson, LLP
- International Application: PCT/JP2008/069033 WO 20081021
- International Announcement: WO2010/046967 WO 20100429
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
The IR camera (10) takes an IR thermal image of a surface of the structure (40). In the IR thermal image, temperature gradient is superposed besides temperature difference between non-defective and defective regions of the structure. The image processing unit (21) of the analysis unit (20) produces an image indicating distribution of a temperature variation other than a temperature gradient by extracting the distribution of the temperature variation from the IR thermal image. The image display unit (30) displays the image produced by the image processing unit (21). Since the distribution of the temperature variation other than the temperature gradient is extracted from the IR thermal image, a temperature difference between defective and non-defective regions in the structure (40) can be clearly displayed. Therefore, even if there exists a temperature gradient on the structure surface, the defect location in the structure can be easily determined.
Public/Granted literature
- US20100260374A1 INFRARED-RAY THERMAL IMAGE ANALYZER Public/Granted day:2010-10-14
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