Invention Grant
US08447562B2 Inspection apparatus and method using penetrating radiation 有权
使用穿透辐射的检查装置和方法

  • Patent Title: Inspection apparatus and method using penetrating radiation
  • Patent Title (中): 使用穿透辐射的检查装置和方法
  • Application No.: US12669118
    Application Date: 2008-07-09
  • Publication No.: US08447562B2
    Publication Date: 2013-05-21
  • Inventor: Alain Dekker
  • Applicant: Alain Dekker
  • Applicant Address: US IL Glenview
  • Assignee: Illinois Tool Works
  • Current Assignee: Illinois Tool Works
  • Current Assignee Address: US IL Glenview
  • Agency: Lowe Hauptman Ham & Berner, LLP
  • Priority: GB0713780.5 20070716
  • International Application: PCT/US2008/069522 WO 20080709
  • International Announcement: WO2009/012097 WO 20090122
  • Main IPC: G06F17/18
  • IPC: G06F17/18
Inspection apparatus and method using penetrating radiation
Abstract:
A method of determining a parameter of an object using penetrating radiation such as X-rays. The parameter of the object could be weight or mass or volume. The method comprises the step of passing the penetrating radiation through the object; determining a first value derived from the total energy of penetrating radiation absorbed by the object; determining a second value related to the mean energy per unit area of penetrating radiation absorbed by the object and determining the parameter from the first and second values. An algorithm representing a proportionality relationship is derived from the first and second value. The parameter is determined by establishing an exponential relationship to an amount derived from the algorithm.
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