Invention Grant
- Patent Title: Inspection apparatus and method using penetrating radiation
- Patent Title (中): 使用穿透辐射的检查装置和方法
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Application No.: US12669118Application Date: 2008-07-09
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Publication No.: US08447562B2Publication Date: 2013-05-21
- Inventor: Alain Dekker
- Applicant: Alain Dekker
- Applicant Address: US IL Glenview
- Assignee: Illinois Tool Works
- Current Assignee: Illinois Tool Works
- Current Assignee Address: US IL Glenview
- Agency: Lowe Hauptman Ham & Berner, LLP
- Priority: GB0713780.5 20070716
- International Application: PCT/US2008/069522 WO 20080709
- International Announcement: WO2009/012097 WO 20090122
- Main IPC: G06F17/18
- IPC: G06F17/18

Abstract:
A method of determining a parameter of an object using penetrating radiation such as X-rays. The parameter of the object could be weight or mass or volume. The method comprises the step of passing the penetrating radiation through the object; determining a first value derived from the total energy of penetrating radiation absorbed by the object; determining a second value related to the mean energy per unit area of penetrating radiation absorbed by the object and determining the parameter from the first and second values. An algorithm representing a proportionality relationship is derived from the first and second value. The parameter is determined by establishing an exponential relationship to an amount derived from the algorithm.
Public/Granted literature
- US20100256952A1 INSPECTION APPARATUS AND METHOD USING PENETRATING RADIATION Public/Granted day:2010-10-07
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