Invention Grant
- Patent Title: Shape measurement method of synthetically combining partial measurements
- Patent Title (中): 合成部分测量的形状测量方法
-
Application No.: US12476970Application Date: 2009-06-02
-
Publication No.: US08447561B2Publication Date: 2013-05-21
- Inventor: Mahito Negishi
- Applicant: Mahito Negishi
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2008-149366 20080606
- Main IPC: G01B11/08
- IPC: G01B11/08

Abstract:
Coordinate transformation parameters are adopted at the time of synthetically combining partial measurement data so as to eliminate the setting error that can get in when a workpiece is set in position on a measuring machine. Then, a shape parameter is adopted to estimate the approximate error shape of the entire workpiece and the approximate error shape is removed from the measurement data. As a result, the residuals are reduced if the measurement data are those of three-dimensional sequences of points. Differences are small when small residuals are compared so that the mismatch is reduced. According to the present invention, the entire measurement data can be synthetically combined without using the conventional concept of overlap.
Public/Granted literature
- US20090306931A1 SHAPE MEASUREMENT METHOD OF SYNTHETICALLY COMBINING PARTIAL MEASUREMENTS Public/Granted day:2009-12-10
Information query