Invention Grant
US08447550B1 Compact fixed-source array test station for calibration of a semi-active laser (SAL) seeker
有权
紧凑的固定源阵列测试站,用于校准半激光(SAL)探测器
- Patent Title: Compact fixed-source array test station for calibration of a semi-active laser (SAL) seeker
- Patent Title (中): 紧凑的固定源阵列测试站,用于校准半激光(SAL)探测器
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Application No.: US13479088Application Date: 2012-05-23
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Publication No.: US08447550B1Publication Date: 2013-05-21
- Inventor: Michael K. Burkland
- Applicant: Michael K. Burkland
- Applicant Address: US MA Waltham
- Assignee: Rayheon Company
- Current Assignee: Rayheon Company
- Current Assignee Address: US MA Waltham
- Agent Eric A. Gifford
- Main IPC: G01C19/00
- IPC: G01C19/00

Abstract:
A fixed-source array test station provides a compact cost-effective high-throughput test bed for testing optical sensors that require stimulus at fixed angular positions. An array of fixed collimated sources at different angular positions in the sensor's FOV are positioned on a surface of a focal sphere at the effective focal length of a spherical lens and aligned along respective radial lines to the center of the spherical lens so that each said divergent optical beam is collimated by the spherical lens to form a collimated optical beam that overlaps the entire entrance pupil of the optical seeker. The sources are activated in accordance with an activation profile in order to calibrate or otherwise test the sensor.
Public/Granted literature
- US20130110440A1 COMPACT FIXED-SOURCE ARRAY TEST STATION FOR CALIBRATION OF A SEMI-ACTIVE LASER (SAL) SEEKER Public/Granted day:2013-05-02
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