Invention Grant
- Patent Title: Measurement of Fourier coefficients using integrating photometric detector
- Patent Title (中): 使用积分光度检测器测量傅里叶系数
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Application No.: US12840849Application Date: 2010-07-21
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Publication No.: US08447546B2Publication Date: 2013-05-21
- Inventor: Yong Jai Cho , Won Chegal , Hyun Mo Cho
- Applicant: Yong Jai Cho , Won Chegal , Hyun Mo Cho
- Applicant Address: KR Daejeon
- Assignee: Korea Research Institute of Standards and Science
- Current Assignee: Korea Research Institute of Standards and Science
- Current Assignee Address: KR Daejeon
- Agency: The Webb Law Firm
- Priority: KR10-2009-0093444 20090930; KR10-2010-0005358 20100120
- Main IPC: G01R13/00
- IPC: G01R13/00

Abstract:
Provided is a measurement method of Fourier coefficients using an integrating photometric detector, wherein, when measuring an exposure (Sj) with a predetermined time interval during a predetermined time period using an integrating photometric detector with respect to light of which amplitude varies with the time period, normalized Fourier coefficients (α′2n, β′2n) for a waveform of an intensity of the light is determined by carrying out a discrete Fourier transform with respect to an equation for the measured exposure (Sj).
Public/Granted literature
- US20110077883A1 Measurement of Fourier Coefficients Using Integrating Photometric Detector Public/Granted day:2011-03-31
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