Invention Grant
- Patent Title: Calibration apparatus and method for assisting accuracy confirmation of parameter for three-dimensional measurement
- Patent Title (中): 用于辅助三维测量参数精度确认的校准装置和方法
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Application No.: US12711814Application Date: 2010-02-24
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Publication No.: US08447097B2Publication Date: 2013-05-21
- Inventor: Shiro Fujieda , Atsushi Taneno , Hiroshi Yano , Yasuyuki Ikeda
- Applicant: Shiro Fujieda , Atsushi Taneno , Hiroshi Yano , Yasuyuki Ikeda
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Foley & Lardner LLP
- Priority: JP2009-059920 20090312; JP2010-004929 20100113
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/36

Abstract:
When computation of a three-dimensional measurement processing parameter is completed, accuracy of a computed parameter can easily be confirmed. After a parameter for three-dimensional measurement is computed through calibration processing using a calibration workpiece in which plural feature points whose positional relationship is well known can be extracted from an image produced by imaging, three-dimensional coordinate computing processing is performed using the computed parameter for the plural feature points included in the stereo image used to compute the parameter. Perspective transformation of each computed three-dimensional coordinate is performed to produce a projection image in which each post-perspective-transformation three-dimensional coordinate is expressed by a predetermined pattern, and the projection image is displayed on a monitor device.
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