Invention Grant
- Patent Title: Disc inspecting method and disc inspecting device
- Patent Title (中): 光盘检查方法和光盘检测装置
-
Application No.: US13235836Application Date: 2011-09-19
-
Publication No.: US08446804B2Publication Date: 2013-05-21
- Inventor: Hiroaki Kobayashi , Toru Aida , Akitoshi Suzuki
- Applicant: Hiroaki Kobayashi , Toru Aida , Akitoshi Suzuki
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Sony Corporation,Sony DADC Corporation
- Current Assignee: Sony Corporation,Sony DADC Corporation
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2010-228373 20101008
- Main IPC: G11B15/52
- IPC: G11B15/52
Abstract:
A disc inspecting method includes: forming recording marks on a disc; scanning the recording marks from inside to outside or from outside to inside of the disc by a pickup unit to read a reproduction signal while rotating a spindle to move a slider by each predetermined width; acquiring reproduction data from the reproduction signal in a signal acquiring unit; and determining whether or not the reproduction data is proper in a calculation unit, and optimizing a formation condition of the recording marks when it is determined that the reproduction data is not proper.
Public/Granted literature
- US20120087222A1 DISC INSPECTING METHOD AND DISC INSPECTING DEVICE Public/Granted day:2012-04-12
Information query
IPC分类:
