Invention Grant
- Patent Title: Spin-torque transfer magneto-resistive memory architecture
- Patent Title (中): 自旋扭矩传递磁阻存储器架构
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Application No.: US12858879Application Date: 2010-08-18
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Publication No.: US08446757B2Publication Date: 2013-05-21
- Inventor: John K. DeBrosse , Yutaka Nakamura
- Applicant: John K. DeBrosse , Yutaka Nakamura
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A memory array device comprising a first memory cell comprising a first magnetic tunnel junction device having a first terminal connected to a first bit line (BLTE) and a second terminal, and a first field effect transistor (FET) having a source terminal connected to a second bit line (BLC), a gate terminal connected to a word line (WL), and a drain terminal connected to the second terminal of the first magnetic tunnel junction device, and a second memory cell comprising, a second magnetic tunnel junction device having a first terminal connected to a third bit line (BLT0) and a second terminal, and a second field effect transistor (FET) having a source terminal connected to the second bit line (BLC), a gate terminal connected to the word line (WL), and a drain terminal connected to the second terminal of the second magnetic tunnel junction device.
Public/Granted literature
- US20120044754A1 Spin-Torque Transfer Magneto-Resistive Memory Architecture Public/Granted day:2012-02-23
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