Invention Grant
US08446145B2 Method for measuring I-V characteristics of solar cell, and solar cell
有权
测量太阳能电池和太阳能电池的I-V特性的方法
- Patent Title: Method for measuring I-V characteristics of solar cell, and solar cell
- Patent Title (中): 测量太阳能电池和太阳能电池的I-V特性的方法
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Application No.: US12700910Application Date: 2010-02-05
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Publication No.: US08446145B2Publication Date: 2013-05-21
- Inventor: Shigeharu Taira , Takeshi Nishiwaki
- Applicant: Shigeharu Taira , Takeshi Nishiwaki
- Applicant Address: JP Moriguchi
- Assignee: Sanyo Electric Co., Ltd.
- Current Assignee: Sanyo Electric Co., Ltd.
- Current Assignee Address: JP Moriguchi
- Agency: MOTS Law, PLLC
- Agent Marvin A. Motsenbocker
- Priority: JP2009-026640 20090206
- Main IPC: G01R1/06
- IPC: G01R1/06

Abstract:
An aspect of the invention provides a method for measuring I-V characteristics of a solar cell, the solar cell comprising a plurality of fine line-shaped electrodes formed on a first surface in a predetermined direction; and a coupling line formed on the first surface that electrically couples at least two fine line-shaped electrodes among the plurality of fine line-shaped electrodes, the coupling line having a line width larger than a line width of the fine line-shaped electrodes. The method includes: contacting a probe pin for voltage measurement with the coupling line; contacting two or more probe pins for current measurement electrically connected to each other with two or more fine line-shaped electrodes including the fine line-shaped electrodes coupled to each other by the coupling line among the plurality of fine line-shaped electrodes; and measuring I-V characteristics while irradiating the first surface with light.
Public/Granted literature
- US20100201349A1 METHOD FOR MEASURING I-V CHARACTERISTICS OF SOLAR CELL, AND SOLAR CELL Public/Granted day:2010-08-12
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