Invention Grant
- Patent Title: Semiconductor device bonding with stress relief connection pads
-
Application No.: US12311027Application Date: 2007-12-20
-
Publication No.: US08446008B2Publication Date: 2013-05-21
- Inventor: Masaki Kasai , Hiroshi Okumura
- Applicant: Masaki Kasai , Hiroshi Okumura
- Applicant Address: JP Kyoto
- Assignee: Rohm Co., Ltd.
- Current Assignee: Rohm Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Rabin & Berdo, P.C.
- Priority: JP2006-348571 20061225; JP2006-348574 20061225
- International Application: PCT/JP2007/074564 WO 20071220
- International Announcement: WO2008/078655 WO 20080703
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
An inventive semiconductor device includes: a semiconductor chip; an internal pad provided on a surface of the semiconductor chip for electrical connection; a surface protective film covering the surface of the semiconductor chip and having a pad opening from which the internal pad is exposed; a stress relief layer provided on the surface protective film and having an opening portion through which the internal pad exposed from the pad opening is exposed; a connection pad including an anchor buried in the pad opening and the opening portion and connected to the internal pad, and a projection provided integrally with the anchor as projecting on the stress relief layer, the projection having a width greater than an opening width of the opening portion; and a metal ball provided for external electrical connection as covering the projection of the connection pad.
Public/Granted literature
- US20100044863A1 Semiconductor device Public/Granted day:2010-02-25
Information query
IPC分类: