Invention Grant
- Patent Title: Three-dimensional measuring device and board inspection device
- Patent Title (中): 三维测量装置和板检测装置
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Application No.: US12669433Application Date: 2008-07-18
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Publication No.: US08436890B2Publication Date: 2013-05-07
- Inventor: Takahiro Mamiya
- Applicant: Takahiro Mamiya
- Applicant Address: JP Aichi
- Assignee: CKD Corporation
- Current Assignee: CKD Corporation
- Current Assignee Address: JP Aichi
- Agency: Osha Liang LLP
- Priority: JP2007-206112 20070808
- International Application: PCT/JP2008/062985 WO 20080718
- International Announcement: WO2009/019966 WO 20090212
- Main IPC: H04N13/00
- IPC: H04N13/00

Abstract:
A three-dimensional measuring device includes an irradiation means capable of irradiating a striped light pattern used for a spatial encoding method and a striped light pattern used for a phase shift method on a measurement object part on a board main body, an imaging means capable of imaging a measurement object part irradiated by the light pattern, an image control means for controlling imaging by the imaging means, a first calculation means for calculating a height of the measurement object part according to the phase shift method based on a multiplicity of image data imaged by the imaging means, and a second calculation means capable of using the spatial encoding method to identify a line corresponding to the measurement object part from among the image data at a time of calculation by the first calculation means by the phase shift method based on the image data.
Public/Granted literature
- US20100194855A1 THREE-DIMENSIONAL MEASURING DEVICE AND BOARD INSPECTION DEVICE Public/Granted day:2010-08-05
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