Invention Grant
US08436890B2 Three-dimensional measuring device and board inspection device 有权
三维测量装置和板检测装置

  • Patent Title: Three-dimensional measuring device and board inspection device
  • Patent Title (中): 三维测量装置和板检测装置
  • Application No.: US12669433
    Application Date: 2008-07-18
  • Publication No.: US08436890B2
    Publication Date: 2013-05-07
  • Inventor: Takahiro Mamiya
  • Applicant: Takahiro Mamiya
  • Applicant Address: JP Aichi
  • Assignee: CKD Corporation
  • Current Assignee: CKD Corporation
  • Current Assignee Address: JP Aichi
  • Agency: Osha Liang LLP
  • Priority: JP2007-206112 20070808
  • International Application: PCT/JP2008/062985 WO 20080718
  • International Announcement: WO2009/019966 WO 20090212
  • Main IPC: H04N13/00
  • IPC: H04N13/00
Three-dimensional measuring device and board inspection device
Abstract:
A three-dimensional measuring device includes an irradiation means capable of irradiating a striped light pattern used for a spatial encoding method and a striped light pattern used for a phase shift method on a measurement object part on a board main body, an imaging means capable of imaging a measurement object part irradiated by the light pattern, an image control means for controlling imaging by the imaging means, a first calculation means for calculating a height of the measurement object part according to the phase shift method based on a multiplicity of image data imaged by the imaging means, and a second calculation means capable of using the spatial encoding method to identify a line corresponding to the measurement object part from among the image data at a time of calculation by the first calculation means by the phase shift method based on the image data.
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