Invention Grant
- Patent Title: Method to determine needle mark and program therefor
- Patent Title (中): 确定针标及其程序的方法
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Application No.: US12726426Application Date: 2010-03-18
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Publication No.: US08436633B2Publication Date: 2013-05-07
- Inventor: Satoshi Sano , Yuji Akasaki
- Applicant: Satoshi Sano , Yuji Akasaki
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Abelman, Frayne & Schwab
- Priority: JP2009-068552 20090319
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
Disclosed is a method to determine a needle mark, which can more accurately determine whether marks formed on electrode pads of devices are probe needle marks, thereby significantly reducing misdetermination of the marks as the probe needle marks. The method includes giving scores, which are used to determine the quality of marks as probe needle marks, to marks formed on a plurality of electrode pads of a plurality of devices, and selecting, based on the scores, an object device including an object electrode pad with an indefinite mark formed thereon, and selecting four comparison devices preceding the object device and nine time-successive comparison devices following the object device at successive times along the test direction, and determining if the indefinite mark of the object device is good or bad as a probe needle mark, by comparing a value of the score given to the indefinite mark of the object device plus scores given to marks formed on the comparison devices' comparison electrode pads corresponding to the object electrode pad, with a reference value.
Public/Granted literature
- US20100237894A1 METHOD TO DETERMINE NEEDLE MARK AND PROGRAM THEREFOR Public/Granted day:2010-09-23
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