Invention Grant
- Patent Title: Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic device
- Patent Title (中): 测量装置,平行测量装置,试验装置和电子装置
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Application No.: US12853851Application Date: 2010-08-10
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Publication No.: US08436604B2Publication Date: 2013-05-07
- Inventor: Kazuhiro Yamamoto , Toshiyuki Okayasu
- Applicant: Kazuhiro Yamamoto , Toshiyuki Okayasu
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2008-083509 20080327
- Main IPC: G01R25/00
- IPC: G01R25/00

Abstract:
Provided is a measurement apparatus that measures a signal under measurement, comprising a first oscillation circuit that receives one pulse of the signal under measurement and begins oscillating according to the pulse of the signal under measurement to output a first oscillated signal; a second oscillation circuit that receives one pulse of a reference signal and begins oscillating according to the pulse of the reference signal to output a second oscillated signal having a period that is different from a period of the first oscillated signal; and a first sampling section that samples the first oscillated signal according to a pulse of the second oscillated signal. The first oscillation circuit and the second oscillation circuit each include a control section that selects one pulse; a delay section that delays the pulse; and a loop line that feeds the pulse back to an input terminal of the delay section.
Public/Granted literature
- US20110121815A1 MEASURING APPARATUS, PARALLEL MEASURING APPARATUS, TESTING APPARATUS AND ELECTRONIC DEVICE Public/Granted day:2011-05-26
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