Invention Grant
US08436418B2 High-voltage semiconductor device with electrostatic discharge protection
有权
具有静电放电保护功能的高压半导体器件
- Patent Title: High-voltage semiconductor device with electrostatic discharge protection
- Patent Title (中): 具有静电放电保护功能的高压半导体器件
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Application No.: US13163734Application Date: 2011-06-20
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Publication No.: US08436418B2Publication Date: 2013-05-07
- Inventor: Chih-Chung Wang , Wei-Lun Hsu , Te-Yuan Wu , Ke-Feng Lin , Shan-Shi Huang , Ming-Tsung Lee , Wen-Fang Lee
- Applicant: Chih-Chung Wang , Wei-Lun Hsu , Te-Yuan Wu , Ke-Feng Lin , Shan-Shi Huang , Ming-Tsung Lee , Wen-Fang Lee
- Applicant Address: TW Science-Based Industrial Park, Hsin Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L29/94
- IPC: H01L29/94

Abstract:
The present invention provides a high-voltage semiconductor device including a deep well, a first doped region disposed in the deep well, a high-voltage well, a second doped region disposed in the high-voltage well, a first gate structure disposed on the high-voltage well between the second doped region and the first doped region, a doped channel region disposed in the high-voltage region and in contact with the second doped region and the deep well, and a third doped region disposed in the high-voltage well. The high-voltage well has a first conductive type, and the deep well, the first doped region, the second doped region, the doped channel region, and the third doped region have a second conductive type different from the first conductive type.
Public/Granted literature
- US20120319189A1 HIGH-VOLTAGE SEMICONDUCTOR DEVICE Public/Granted day:2012-12-20
Information query
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