Invention Grant
- Patent Title: Method for taking gamma-gamma density measurements
- Patent Title (中): 伽玛伽玛密度测量方法
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Application No.: US12755713Application Date: 2010-04-07
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Publication No.: US08436294B2Publication Date: 2013-05-07
- Inventor: Feyzi Inanc , W. Allen Gilchrist, Jr.
- Applicant: Feyzi Inanc , W. Allen Gilchrist, Jr.
- Applicant Address: US TX Houston
- Assignee: Baker Hughes Incorporated
- Current Assignee: Baker Hughes Incorporated
- Current Assignee Address: US TX Houston
- Agency: Cantor Colburn LLP
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G01V5/08 ; G01V5/12

Abstract:
A method for performing a measurement of a property downhole includes: using an instrument including an irradiator including a pulsed neutron generator, a moderator and a material including a high cross section for capturing thermal neutrons downhole, generating inelastic gamma photons from neutron interactions in the moderator and generating capture gamma photons from neutron interactions in the material; irradiating sub-surface materials proximate to the instrument with the inelastic gamma photons and the capture gamma photons; detecting radiation scattered by the sub-surface materials; and estimating the property according to the detected radiation. A system is also disclosed.
Public/Granted literature
- US20100252724A1 METHOD FOR TAKING GAMMA-GAMMA DENSITY MEASUREMENTS Public/Granted day:2010-10-07
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