Invention Grant
- Patent Title: Methods of manufacturing semiconductor devices
- Patent Title (中): 制造半导体器件的方法
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Application No.: US12656440Application Date: 2010-01-29
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Publication No.: US08435855B2Publication Date: 2013-05-07
- Inventor: Kang-Uk Kim , Yong-Chul Oh
- Applicant: Kang-Uk Kim , Yong-Chul Oh
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2009-0007954 20090202
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method of manufacturing a semiconductor device, the method including providing a substrate, the substrate including single crystalline silicon and having the first region and a second region; growing a pillar from a top surface of the substrate in the first region; forming a vertical channel transistor including a first gate structure such that first gate structure surrounds a central portion of the pillar; and forming a second transistor on the second region of the substrate such that the second transistor includes a second gate structure.
Public/Granted literature
- US20100197121A1 Methods of manufacturing semiconductor devices Public/Granted day:2010-08-05
Information query
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