Invention Grant
- Patent Title: Format transformation of test data
- Patent Title (中): 测试数据的格式转换
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Application No.: US12293075Application Date: 2006-03-13
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Publication No.: US08418010B2Publication Date: 2013-04-09
- Inventor: Jochen Rivoir
- Applicant: Jochen Rivoir
- Applicant Address: SG Singapore
- Assignee: Advantest (Singapore) Pte Ltd
- Current Assignee: Advantest (Singapore) Pte Ltd
- Current Assignee Address: SG Singapore
- International Application: PCT/EP2006/060651 WO 20060313
- International Announcement: WO2007/104355 WO 20070920
- Main IPC: G01R31/3183
- IPC: G01R31/3183 ; G01R31/327

Abstract:
A device for processing test data, the device having a data input interface adapted for receiving primary test data indicative of a test carried out for testing a device under test, the primary test data being provided in a primary format, a processing unit adapted for generating secondary test data in a secondary format by transforming, by carrying out a coordinate transformation, the primary test data from the primary format into the secondary format, and a data output interface adapted for providing the secondary test data in the secondary format for storing the secondary test data in a plurality of storage units.
Public/Granted literature
- US20100011252A1 FORMAT TRANSFORMATION OF TEST DATA Public/Granted day:2010-01-14
Information query
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