Invention Grant
- Patent Title: Set sampling controls instruction
- Patent Title (中): 设置采样控制指令
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Application No.: US12901805Application Date: 2010-10-11
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Publication No.: US08417837B2Publication Date: 2013-04-09
- Inventor: Jane H. Bartik , Lisa C. Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, Jr. , Phil C. Yeh
- Applicant: Jane H. Bartik , Lisa C. Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, Jr. , Phil C. Yeh
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent John E. Campbell; Blanche E. Schiller, Esq.
- Main IPC: G06F17/00
- IPC: G06F17/00 ; G06F3/00 ; G06F5/00 ; G06F15/00 ; G06F15/76 ; G06F9/30 ; G06F9/40 ; G06F7/38 ; G06F9/00 ; G06F9/44

Abstract:
A measurement sampling facility takes snapshots of the central processing unit (CPU) on which it is executing at specified sampling intervals to collect data relating to tasks executing on the CPU. The collected data is stored in a buffer, and at selected times, an interrupt is provided to remove data from the buffer to enable reuse thereof. The interrupt is not taken after each sample, but in sufficient time to remove the data and minimize data loss.
Public/Granted literature
- US20110029758A1 CENTRAL PROCESSING UNIT MEASUREMENT FACILITY Public/Granted day:2011-02-03
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