Invention Grant
- Patent Title: Apparatus and method for dimensional metrology
- Patent Title (中): 尺寸计量仪器和方法
-
Application No.: US10687861Application Date: 2003-10-17
-
Publication No.: US08417370B2Publication Date: 2013-04-09
- Inventor: Anthony J. Griggs , Charles Burbank , William Wilcox , Kenneth Woodbine
- Applicant: Anthony J. Griggs , Charles Burbank , William Wilcox , Kenneth Woodbine
- Applicant Address: SE Stockholm
- Assignee: Hexagon Metrology AB
- Current Assignee: Hexagon Metrology AB
- Current Assignee Address: SE Stockholm
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
Generating a machine tool program for performing coordinate measurements. The machine tool program may be communicated to a machine tool controller such that the machine tool controller is operable to execute the machine tool program. The machine tool program may be generated from a dimensional metrology program. As part of generating the machine tool program, a path definition and a machine definition may be combined. Measurement data resulting from an execution of the machine tool program may be received by a data server and analyzed using dimensional metrology analysis. Indicators may be provided within the machine tool program to be used during dimensional metrology analysis.
Public/Granted literature
- US20050085940A1 Apparatus and method for dimensional metrology Public/Granted day:2005-04-21
Information query