Invention Grant
US08416609B2 Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems
有权
交叉点存储器单元,非易失性存储器阵列,读取存储器单元的方法,对存储器单元进行编程的方法,写入存储器单元和从存储单元读取的方法以及计算机系统
- Patent Title: Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems
- Patent Title (中): 交叉点存储器单元,非易失性存储器阵列,读取存储器单元的方法,对存储器单元进行编程的方法,写入存储器单元和从存储单元读取的方法以及计算机系统
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Application No.: US12705918Application Date: 2010-02-15
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Publication No.: US08416609B2Publication Date: 2013-04-09
- Inventor: Roy E. Meade
- Applicant: Roy E. Meade
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: G11C11/24
- IPC: G11C11/24

Abstract:
Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, and methods of writing to and reading from a memory cell are described. In one embodiment, a cross-point memory cell includes a word line extending in a first direction, a bit line extending in a second direction different from the first direction, the bit line and the word line crossing without physically contacting each other, and a capacitor formed between the word line and the bit line where such cross. The capacitor comprises a dielectric material configured to prevent DC current from flowing from the word line to the bit line and from the bit line to the word line.
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