Invention Grant
US08416609B2 Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems 有权
交叉点存储器单元,非易失性存储器阵列,读取存储器单元的方法,对存储器单元进行编程的方法,写入存储器单元和从存储单元读取的方法以及计算机系统

  • Patent Title: Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems
  • Patent Title (中): 交叉点存储器单元,非易失性存储器阵列,读取存储器单元的方法,对存储器单元进行编程的方法,写入存储器单元和从存储单元读取的方法以及计算机系统
  • Application No.: US12705918
    Application Date: 2010-02-15
  • Publication No.: US08416609B2
    Publication Date: 2013-04-09
  • Inventor: Roy E. Meade
  • Applicant: Roy E. Meade
  • Applicant Address: US ID Boise
  • Assignee: Micron Technology, Inc.
  • Current Assignee: Micron Technology, Inc.
  • Current Assignee Address: US ID Boise
  • Agency: Wells St. John P.S.
  • Main IPC: G11C11/24
  • IPC: G11C11/24
Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems
Abstract:
Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, and methods of writing to and reading from a memory cell are described. In one embodiment, a cross-point memory cell includes a word line extending in a first direction, a bit line extending in a second direction different from the first direction, the bit line and the word line crossing without physically contacting each other, and a capacitor formed between the word line and the bit line where such cross. The capacitor comprises a dielectric material configured to prevent DC current from flowing from the word line to the bit line and from the bit line to the word line.
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