Invention Grant
US08416426B2 Calibrating jig, profile measuring device, and method of offset calculation
有权
校准夹具，型材测量装置和偏移计算方法
- Patent Title: Calibrating jig, profile measuring device, and method of offset calculation
- Patent Title (中): 校准夹具，型材测量装置和偏移计算方法
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Application No.: US13369079Application Date: 2012-02-08
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Publication No.: US08416426B2Publication Date: 2013-04-09
- Inventor: Masaoki Yamagata , Yasuhiro Takahama , Hiraku Ishiyama , Kentaro Nemoto
- Applicant: Masaoki Yamagata , Yasuhiro Takahama , Hiraku Ishiyama , Kentaro Nemoto
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Oliff & Berridge, PLC
- Priority: JP2008-180084 20080710
- Main IPC: G01B11/24
- IPC: G01B11/24
Abstract:
A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof.
Public/Granted literature
- US20120188558A1 CALIBRATING JIG, PROFILE MEASURING DEVICE, AND METHOD OF OFFSET CALCULATION Public/Granted day:2012-07-26
Information query
