Invention Grant
- Patent Title: Wavefront imaging sensor
- Patent Title (中): 波前成像传感器
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Application No.: US12792177Application Date: 2010-06-02
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Publication No.: US08416400B2Publication Date: 2013-04-09
- Inventor: Xiquan Cui , Changhuei Yang
- Applicant: Xiquan Cui , Changhuei Yang
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Agent Sheila Martinez-Lemke
- Main IPC: G01J1/00
- IPC: G01J1/00

Abstract:
Embodiments of the present invention relate to a wavefront imaging sensor (WIS) comprising an aperture layer having an aperture, a light detector having a surface and a transparent layer between the aperture layer and the light detector. The light detector can receive a light projection at the surface from light passing through the aperture. The light detector can also separately measure amplitude and phase information of a wavefront at the aperture based on the received light projection. The transparent layer has a thickness designed to locate the surface of the light detector approximately at a self-focusing plane in a high Fresnel number regime to narrow the light projection.
Public/Granted literature
- US20100309457A1 Wavefront Imaging Sensor Public/Granted day:2010-12-09
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