Invention Grant
- Patent Title: Monitoring system and monitoring method which monitor persons and materials passing through monitoring point
- Patent Title (中): 监测系统和监测方法,监测人员和材料通过监测点
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Application No.: US12664359Application Date: 2008-05-23
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Publication No.: US08416077B2Publication Date: 2013-04-09
- Inventor: Akira Monden
- Applicant: Akira Monden
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2007-157161 20070614
- International Application: PCT/JP2008/059536 WO 20080523
- International Announcement: WO2008/152897 WO 20081218
- Main IPC: G08B13/14
- IPC: G08B13/14

Abstract:
A monitoring system according to the present invention includes a detecting unit, a tracking unit, a place judging unit and a reporting unit. When a pass unpermitted material that is not permitted to pass through a pass monitoring point passes through the pass monitoring point, the detecting unit detects the pass unpermitted material as a fraudulent passing material. The tracking unit tracks a position of the fraudulent passing material detected by the detecting unit. The place judging unit judges whether or not the fraudulent passing material exists inside a predetermined area. The reporting unit visibly reports the position of the fraudulent passing material and the judged result by the place judging unit.
Public/Granted literature
- US20100194566A1 MONITORING SYSTEM AND MONITORING METHOD Public/Granted day:2010-08-05
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