Invention Grant
- Patent Title: Capacitance measurement circuit and method
- Patent Title (中): 电容测量电路及方法
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Application No.: US12639484Application Date: 2009-12-16
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Publication No.: US08415957B2Publication Date: 2013-04-09
- Inventor: He-Wei Huang , Chih-Yuan Chang , Hui-Hung Chang
- Applicant: He-Wei Huang , Chih-Yuan Chang , Hui-Hung Chang
- Applicant Address: TW Hsinchu
- Assignee: Novatek Microelectronics Corp.
- Current Assignee: Novatek Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Rabin & Berdo, P.C.
- Priority: TW98122437A 20090702
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A capacitance measurement circuit and method are provided. A storage capacitor is pre-charged. Charge transfer is performed between an under-test capacitor and the storage capacitor. The storage capacitor is discharged and charged according to a relationship between a voltage of the storage capacitor and a reference voltage. The capacitance of the under-test capacitor is measured according to the voltage on the storage capacitor.
Public/Granted literature
- US20110001491A1 CAPACITANCE MEASUREMENT CIRCUIT AND METHOD Public/Granted day:2011-01-06
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