An exemplary embodiment of machine motion control system for testing electronic devices includes a machine and a control module electrically connected to the machine. The machine secures the electronic devices and includes a sensing unit and a servo unit, the sensing unit obtains different test parameters of the electronic devices to generate corresponding sensed signal. The control module includes a signal conversion unit electrically connected to the sensing unit and a main control circuit, the main control circuit is electrically connected to the signal conversion unit and the servo unit. The signal conversion unit converts the sensed signal into corresponding command signal, and the main control circuit drives and controls the servo unit to adjust the motion state and test strength on the electronic device according to the command signal.