Invention Grant
US08413033B2 Device and method for calculating backward state metrics of a trellis
有权
用于计算网格的后向状态度量的装置和方法
- Patent Title: Device and method for calculating backward state metrics of a trellis
- Patent Title (中): 用于计算网格的后向状态度量的装置和方法
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Application No.: US12509276Application Date: 2009-07-24
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Publication No.: US08413033B2Publication Date: 2013-04-02
- Inventor: Guy Drory , Ron Bercovich , Aviel Livay , Ilia Moskovich , Yuval Neeman
- Applicant: Guy Drory , Ron Bercovich , Aviel Livay , Ilia Moskovich , Yuval Neeman
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: H03M13/00
- IPC: H03M13/00
Abstract:
A method for calculating backward state metrics of a trellis, the method includes: performing a radix-K calculation of backward state matrices of multiple states of at least one time instance of a trellis; and performing a radix-J calculation of backward state matrices of multiple states of at least one other time instance of the trellis; wherein K differs from J.
Public/Granted literature
- US20110019781A1 DEVICE AND METHOD FOR CALCULATING BACKWARD STATE METRICS OF A TRELLIS Public/Granted day:2011-01-27
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