Invention Grant
US08410618B2 Microelectronic assembly with joined bond elements having lowered inductance
失效
具有接合结合元件的微电子组件具有降低的电感
- Patent Title: Microelectronic assembly with joined bond elements having lowered inductance
- Patent Title (中): 具有接合结合元件的微电子组件具有降低的电感
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Application No.: US13196192Application Date: 2011-08-02
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Publication No.: US08410618B2Publication Date: 2013-04-02
- Inventor: Belgacem Haba , Philip Damberg , Philip R. Osborn
- Applicant: Belgacem Haba , Philip Damberg , Philip R. Osborn
- Applicant Address: US CA San Jose
- Assignee: Tessera, Inc.
- Current Assignee: Tessera, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: KR10-2010-0040446 20100430
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40

Abstract:
A microelectronic assembly includes a semiconductor chip having chip contacts exposed at a first face and a substrate juxtaposed with a face of the chip. A conductive bond element can electrically connect a first chip contact with a first substrate contact of the substrate, and a second conductive bond element can electrically connect the first chip contact with a second substrate contact. The first bond element can have a first end metallurgically joined to the first chip contact and a second end metallurgically joined to the first substrate contact. A first end of the second bond element can be metallurgically joined to the first bond element. The second bond element may or may not touch the first chip contact or the substrate contact. A third bond element can be joined to ends of first and second bond elements which are joined to substrate contacts or to chip contacts. In one embodiment, a bond element can have a looped connection, having first and second ends joined at a first contact and a middle portion joined to a second contact.
Public/Granted literature
- US20110285020A1 MICROELECTRONIC ASSEMBLY WITH JOINED BOND ELEMENTS HAVING LOWERED INDUCTANCE Public/Granted day:2011-11-24
Information query
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