Invention Grant
- Patent Title: System and method for monitoring debug events
- Patent Title (中): 用于监控调试事件的系统和方法
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Application No.: US11864292Application Date: 2007-09-28
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Publication No.: US08407457B2Publication Date: 2013-03-26
- Inventor: William C. Moyer
- Applicant: William C. Moyer
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Joanna G. Chiu; Robert L. King
- Main IPC: G06F9/00
- IPC: G06F9/00

Abstract:
A system has a pipelined processor for executing a plurality of instructions by sequentially fetching, decoding, executing and writing results associated with execution of each instruction. Debug circuitry is coupled to the pipelined processor for monitoring execution of the instructions to determine when a debug event occurs. The debug circuitry generates a debug exception to interrupt instruction processing flow. The debug circuitry has control circuitry for indicating a number of instructions, if any, that complete instruction execution between an instruction that caused the debug event and a point in instruction execution when the exception is taken.
Public/Granted literature
- US20090089547A1 SYSTEM AND METHOD FOR MONITORING DEBUG EVENTS Public/Granted day:2009-04-02
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