Invention Grant
US08407150B2 Reliability evaluation device, reliability evaluation method, and computer program product
有权
可靠性评估装置,可靠性评估方法和计算机程序产品
- Patent Title: Reliability evaluation device, reliability evaluation method, and computer program product
- Patent Title (中): 可靠性评估装置,可靠性评估方法和计算机程序产品
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Application No.: US11653250Application Date: 2007-01-16
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Publication No.: US08407150B2Publication Date: 2013-03-26
- Inventor: Hironobu Kitajima , Ryo Ochitani
- Applicant: Hironobu Kitajima , Ryo Ochitani
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2006-135618 20060515
- Main IPC: G06Q99/00
- IPC: G06Q99/00

Abstract:
A reliability evaluation device includes a route acquiring unit that acquires a route from a starting point to a verification point of an application procedure as a group of paths indicative of relation between objects used for identity verification at each step based on data that includes the paths, a direction in which information is transferred, and path reliabilities indicative of accuracy of transferring the information, and a verification-point-reliability computing unit that computes reliability of the application procedure at the verification point by multiplying the path reliabilities by the reliability at the starting point.
Public/Granted literature
- US20070283206A1 Reliability evaluation device, Reliability evaluation method, and computer program product Public/Granted day:2007-12-06
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