Invention Grant
US08405059B2 Method and apparatus for improving the resolution and/or sectioning ability of an imaging system
失效
用于提高成像系统的分辨率和/或分割能力的方法和装置
- Patent Title: Method and apparatus for improving the resolution and/or sectioning ability of an imaging system
- Patent Title (中): 用于提高成像系统的分辨率和/或分割能力的方法和装置
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Application No.: US12525435Application Date: 2008-02-01
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Publication No.: US08405059B2Publication Date: 2013-03-26
- Inventor: Rainer W Heintzmann , Kai Wicker
- Applicant: Rainer W Heintzmann , Kai Wicker
- Applicant Address: GB London
- Assignee: King's College London
- Current Assignee: King's College London
- Current Assignee Address: GB London
- Agency: Carmody & Torrance LLP
- Priority: GB0702051.4 20070202; GB0712518.0 20070627
- International Application: PCT/GB2008/000338 WO 20080201
- International Announcement: WO2008/093099 WO 20080807
- Main IPC: G02B27/42
- IPC: G02B27/42

Abstract:
Embodiments of the invention allow the operation of confocal microscopes with relatively open pinholes (e.g. 1 Airy unit) whilst still giving a significant XY resolution improvement. In addition axial (Z) discrimination or resolution may also be improved. This is achieved by splitting the emitted light path in an interferometric fashion. One of the split beams is then directed to an image transformation system, which may perform an image inversion which inverts at least one coordinate in image space. The transformed beam and the non-transformed beam are then recombined in an interferometric fashion (i.e. coherently added), which provides an interference effect resulting in increased resolution of the image. Where the embodiments are being used in a confocal application, the resulting combined beam can then be subject to a spatially discriminating means, such as a pinhole, or the like.
Public/Granted literature
- US20100059696A1 Method and Apparatus for Improving Image Resolution Public/Granted day:2010-03-11
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