Invention Grant
- Patent Title: Nonvolatile semiconductor memory device
- Patent Title (中): 非易失性半导体存储器件
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Application No.: US12825924Application Date: 2010-06-29
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Publication No.: US08400815B2Publication Date: 2013-03-19
- Inventor: Yuri Terada , Hiroshi Maejima
- Applicant: Yuri Terada , Hiroshi Maejima
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-190472 20090819
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A nonvolatile semiconductor memory device according to an embodiment includes: a memory cell array including a plurality of first lines and second lines intersecting each other and a plurality of memory cells connected at intersections of the plurality of first lines and second lines; and a first line control circuit and a second line control circuit configured to select the first lines and the second lines respectively to supply a voltage or current necessary for a resetting operation or a setting operation on the memory cells. The first line control circuit supplies unselected ones of the first lines with an unselecting voltage corresponding to the distance between the unselected first lines and the second line control circuit.
Public/Granted literature
- US20110044090A1 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2011-02-24
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