Invention Grant
- Patent Title: Enclosure for an optical inspection apparatus
- Patent Title (中): 光学检测仪器外壳
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Application No.: US13184024Application Date: 2011-07-15
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Publication No.: US08400628B2Publication Date: 2013-03-19
- Inventor: Denis Lépine
- Applicant: Denis Lépine
- Applicant Address: CA Quebec
- Assignee: Centre de Recherche Industrielle du Quebec
- Current Assignee: Centre de Recherche Industrielle du Quebec
- Current Assignee Address: CA Quebec
- Agent Jean-Claude Boudreau
- Priority: CA2738386 20110428
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/88

Abstract:
An enclosure for an optical inspection apparatus for scanning the profile of at least one surface of an article moving along a travel path axis, which apparatus having a frame for mounting a profile sensor unit using a laser source, includes a peripheral portion connected to the frame and forming spaced apart peripheral edges defining a space in which the frame and the profile sensor unit are contained, and front end and rear end portions each having an opening aligned with the travel path axis to allow the movement of the article through the apparatus. At least one of the front and rear end portions is provided with a pair of access doors having outer closing edges adapted to mate with corresponding portions of the peripheral edges, and inner closing edges adapted to mate one with another at first portions thereof, wherein at least one of the inner closing edges is provided with a clearance at a second portion thereof to define one of the openings whenever the access doors are brought one toward another to a closing position. The second portion is provided with at least one shielding element adjacent to the clearance to confine reflections of the laser beam within the enclosure while allowing the movement of the article.
Public/Granted literature
- US20120274930A1 ENCLOSURE FOR AN OPTICAL INSPECTION APPARATUS Public/Granted day:2012-11-01
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