Invention Grant
- Patent Title: Photo-detector and method of measuring light
- Patent Title (中): 光电检测器和测光方法
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Application No.: US12922721Application Date: 2009-03-11
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Publication No.: US08400627B2Publication Date: 2013-03-19
- Inventor: Martin Jacobus Johan Jak , Theodorus Johannes Petrus Van Den Biggelaar , Eduard Johannes Meijer , Eugene Timmering
- Applicant: Martin Jacobus Johan Jak , Theodorus Johannes Petrus Van Den Biggelaar , Eduard Johannes Meijer , Eugene Timmering
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Agent Mark Beloborodov; Kenneth Springer
- Priority: EP08153115 20080320
- International Application: PCT/IB2009/051013 WO 20090311
- International Announcement: WO2009/115945 WO 20090924
- Main IPC: G01J1/42
- IPC: G01J1/42

Abstract:
Proposed is a light sensor (1), comprising at least one wavelength selective photo-detector (10), a lens (20) and an aperture (30).The wavelength selective photo-detector allows detecting light within a predefined wavelength range falling on the sensor. The lens project light on the photo-detector and the aperture defines a field of view of the light sensor. The photo-detector (10), the lens (20), and the aperture (30) are arranged in a telecentric configuration. Advantageously, this allows light to impinge on the wavelength selective photo-detector within a predefined range of angles irrespective of the direction of the light incident on the aperture, thus removing the angle dependent response of the wavelength selective photo-detector.
Public/Granted literature
- US20110007306A1 PHOTO-DETECTOR AND METHOD OF MEASURING LIGHT Public/Granted day:2011-01-13
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