Invention Grant
- Patent Title: Method for the selective doping of silicon and silicon substrate treated therewith
- Patent Title (中): 用于处理硅和硅衬底的选择性掺杂的方法
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Application No.: US12903804Application Date: 2010-10-13
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Publication No.: US08399343B2Publication Date: 2013-03-19
- Inventor: Dirk Habermann
- Applicant: Dirk Habermann
- Applicant Address: DE
- Assignee: Gebr. Schmid GmbH & Co.
- Current Assignee: Gebr. Schmid GmbH & Co.
- Current Assignee Address: DE
- Agency: Akerman Senterfitt
- Priority: DE102008019402 20080414
- Main IPC: H01L21/316
- IPC: H01L21/316

Abstract:
A method for the selective doping of silicon of a silicon substrate (1) for producing a pn-junction in the silicon is characterized by the following steps: a) Providing the surface of the silicon substrate (1) with a doping agent (2) based on phosphorous, b) heating the silicon substrate (1) for creating a phosphorous silicate glass (2) on the surface of the silicon, wherein phosphorous diffuses into the silicon as a first doping (3), c) applying a mask (4) on the phosphorous silicate glass (2), covering the regions (5) that are later highly doped, d) removing the phosphorous silicate glass (2) in the non-masked regions, e) removing the mask (4) from the phosphorous silicate glass (2), f) again heating for the further diffusion of phosphorous from the phosphorous silicate glass (2) into the silicon as a second doping for creating the highly doped regions (5), g); complete removal of the phosphorous silicate glass (2) from the silicon.
Public/Granted literature
- US20110114168A1 Method for the Selective Doping of Silicon and Silicon Substrate Treated Therewith Public/Granted day:2011-05-19
Information query
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