Invention Grant
- Patent Title: Sensor for noncontact profiling of a surface
- Patent Title (中): 用于表面非接触式分析的传感器
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Application No.: US13300749Application Date: 2011-11-21
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Publication No.: US08393009B2Publication Date: 2013-03-05
- Inventor: Franz Josef Giessibl
- Applicant: Franz Josef Giessibl
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent David S. Safran
- Priority: DE102010052037 20101123
- Main IPC: G01B13/16
- IPC: G01B13/16 ; G01Q70/08 ; G01Q60/24

Abstract:
A sensor for scanning a surface with an oscillating cantilever (12), made from piezoelectric material that is suitable for a transverse oscillation of the free end of a beam, holding an electrically conductive probe tip (14) on the free end of the beam in transverse direction, a first deflection electrode (26A, 26B) and an inversely phased second electrode (28A, 28B, 28C) being provided to collect charges that are separated within the space of the deflection electrodes (34, 36). The cantilever (12) is provided with at least one electrode (30) in addition to the deflection electrodes (26A, 26B, 28A, 28B, 28C) that provides electrical contact to the tip (14), the at least one additional electrode being located in a region on the deflecting beam where the surface charge density due to the strain caused by beam deflection (34, 36) is smaller than in the region where the deflection electrodes are located.
Public/Granted literature
- US20120131704A1 SENSOR FOR NONCONTACT PROFILING OF A SURFACE Public/Granted day:2012-05-24
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