Invention Grant
- Patent Title: Method and apparatus for analyzing application
- Patent Title (中): 用于分析应用的方法和装置
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Application No.: US12656091Application Date: 2010-01-15
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Publication No.: US08392892B2Publication Date: 2013-03-05
- Inventor: Akihiko Matsuo , Yoshiharu Maeda , Kohji Wada , Shigeo Suto
- Applicant: Akihiko Matsuo , Yoshiharu Maeda , Kohji Wada , Shigeo Suto
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/45

Abstract:
An application analyzing method includes extracting a variable corresponding to a particular input data item and information regarding a value of the variable by analyzing a plurality of source programs constituting an application, record information of a database used by the application, and execution control information of the application, and outputting, based on the variable and the information regarding the value of the variable extracted in the extracting, information regarding a presumed value with respect to the input data item as presumed requirement information.
Public/Granted literature
- US20100122240A1 Method and apparatus for analyzing application Public/Granted day:2010-05-13
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