Invention Grant
- Patent Title: Detection and removal of hazards during optimization of logic circuits
- Patent Title (中): 在逻辑电路优化期间检测和消除危险
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Application No.: US12399119Application Date: 2009-03-06
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Publication No.: US08392858B2Publication Date: 2013-03-05
- Inventor: Feng Shi
- Applicant: Feng Shi
- Applicant Address: US MA Woburn
- Assignee: Skyworks Solutions, Inc.
- Current Assignee: Skyworks Solutions, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Weide & Miller, Ltd.
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method of generating a hazard-free representation of a logic circuit that can leverage the powerful and mature synchronous-circuit CAD synthesis tools. In a representative embodiment of the method, an initial representation of a specified asynchronous logic circuit is synthesized using one of such CAD tools. The initial representation is then analyzed to identify hazardous transitions and modified, e.g., by iteratively inserting additional logic aimed at preventing the identified hazardous transitions from producing glitches, until a hazard-free representation of the specified asynchronous logic circuit is produced.
Public/Granted literature
- US20100229143A1 DETECTION AND REMOVAL OF HAZARDS DURING OPTIMIZATION OF LOGIC CIRCUITS Public/Granted day:2010-09-09
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