Invention Grant
US08392855B2 Transferring pattern onto semiconductor substrate using optimum transfer condition determined for each divided area 有权
使用为每个分割区域确定的最佳转印条件将图案转印到半导体衬底上

Transferring pattern onto semiconductor substrate using optimum transfer condition determined for each divided area
Abstract:
According to one embodiment, a pattern forming method comprises transferring a pattern formed in a surface of a template to a plurality of chip areas in a semiconductor substrate under different transfer conditions. Furthermore, the transferring the pattern formed in the surface of the template to the plurality of chip areas in the semiconductor substrate under the different transfer conditions comprises transferring the pattern formed in the surface of the template to the semiconductor substrate at least twice under each identical transfer condition. Moreover, the pattern forming method comprises dividing each of the plurality of chip areas into a plurality of areas, determining an optimum condition for each set of corresponding divided areas in the plurality of chip areas, and transferring the pattern onto the semiconductor substrate using the optimum transfer condition determined for each divided area.
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