Invention Grant
US08392796B2 Reliability, availability, and serviceability solution for memory technology
有权
内存技术的可靠性,可用性和可维护性解决方案
- Patent Title: Reliability, availability, and serviceability solution for memory technology
- Patent Title (中): 内存技术的可靠性,可用性和可维护性解决方案
-
Application No.: US13361769Application Date: 2012-01-30
-
Publication No.: US08392796B2Publication Date: 2013-03-05
- Inventor: Kuljit S. Bains , Joseph H. Salmon
- Applicant: Kuljit S. Bains , Joseph H. Salmon
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
Embodiments of the invention are generally directed to systems, methods, and apparatuses for reliability, availability, and serviceability solutions for memory technology. In some embodiments, a host determines the configuration of the memory subsystem during initialization. The host selects a write cyclic redundancy code (CRC) mechanism and a read CRC mechanism based, at least in part, on the configuration of the memory subsystem. Other embodiments are described and claimed.
Public/Granted literature
- US20120131414A1 RELIABILITY, AVAILABILITY, AND SERVICEABILITY SOLUTION FOR MEMORY TECHNOLOGY Public/Granted day:2012-05-24
Information query
IPC分类: