Invention Grant
US08392770B2 Resistance change memory device having high-speed two-step write mode
有权
具有高速两步写入模式的电阻变化存储器件
- Patent Title: Resistance change memory device having high-speed two-step write mode
- Patent Title (中): 具有高速两步写入模式的电阻变化存储器件
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Application No.: US12691169Application Date: 2010-01-21
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Publication No.: US08392770B2Publication Date: 2013-03-05
- Inventor: Haruki Toda
- Applicant: Haruki Toda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-060945 20090313
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C7/00

Abstract:
A resistance change memory device including a cell array, in which memory cells are arranged, the memory cell being reversibly set in one of a first data state and a second data state defined in accordance with the difference of the resistance value, wherein the memory device has a data write mode including: a first write procedure for writing the first data in the cell array; and a second write procedure for writing the second data in the cell array.
Public/Granted literature
- US20100235714A1 RESISTANCE CHANGE MEMORY DEVICE Public/Granted day:2010-09-16
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