Invention Grant
- Patent Title: Data channel test apparatus and method thereof
- Patent Title (中): 数据通道测试装置及其方法
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Application No.: US13033294Application Date: 2011-02-23
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Publication No.: US08392767B2Publication Date: 2013-03-05
- Inventor: Hong Beom Pyeon
- Applicant: Hong Beom Pyeon
- Applicant Address: CA Ottawa, Ontario
- Assignee: MOSAID Technologies Incorporated
- Current Assignee: MOSAID Technologies Incorporated
- Current Assignee Address: CA Ottawa, Ontario
- Agency: Borden Ladner Gervais LLP
- Agent Mukundan Chakrapani
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R27/28 ; G01R31/00 ; G01R31/14 ; G11C7/00 ; G11C29/00

Abstract:
A system includes a plurality of devices that are connected in series and a controller that communicates with the devices. Each of the devices has a plurality of input ports and corresponding output ports. The outputs of one device and the inputs of a next device are interconnected. The controller is coupled to the first device and the last device of the series-connection. The controller applies a test pattern to the plurality of input ports at the first device connected in series, by the controller. Each data channel defines a data path between corresponding pairs of input and output ports of the first and last devices. A data channel is enabled if the test pattern is detected at its corresponding output port.
Public/Granted literature
- US20110154137A1 DATA CHANNEL TEST APPARATUS AND METHOD THEREOF Public/Granted day:2011-06-23
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