Invention Grant
US08392137B2 Method and apparatus for testing RFID tags for mass production
有权
用于大规模生产的RFID标签测试方法和设备
- Patent Title: Method and apparatus for testing RFID tags for mass production
- Patent Title (中): 用于大规模生产的RFID标签测试方法和设备
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Application No.: US12705083Application Date: 2010-02-12
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Publication No.: US08392137B2Publication Date: 2013-03-05
- Inventor: Tai Won Youn
- Applicant: Tai Won Youn
- Applicant Address: US NM Albuquerque
- Assignee: Amtech Systems, LLC
- Current Assignee: Amtech Systems, LLC
- Current Assignee Address: US NM Albuquerque
- Agency: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
A testing system and method for testing glass-mounted RFID tags such as tags mounted on vehicle windows. A testing carrier for use in a test chamber simulates the effect on the tag of the mounting glass. The test chamber and carrier are calibrated by first mounting the tag on the test carrier and making sensitivity measurements and then mounting the tag on glass that is representative of the actual production environment. Comparisons are made between the two measurements and calibration factors are derived to compensate for differences between the actual mounting glass and the test carrier. The test carrier is designed to provide uniform pressure against the tag to minimize any distortions that would alter the sensitivity of the tag.
Public/Granted literature
- US20110202299A1 Method and Apparatus for Testing RFID Tags for Mass Production Public/Granted day:2011-08-18
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