Invention Grant
- Patent Title: In-place management of semiconductor equipment recipes
- Patent Title (中): 半导体设备配方的就地管理
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Application No.: US12833350Application Date: 2010-07-09
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Publication No.: US08392136B2Publication Date: 2013-03-05
- Inventor: Chris W. Lee , Dominic G. David
- Applicant: Chris W. Lee , Dominic G. David
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01N21/00

Abstract:
Systems and methods for managing optical inspection target components are disclosed. A method may include, but is not limited to: storing at least one external recipe component at an inspection tool node; associating at least one proxy component with the at least one external recipe component; associating the at least one external recipe component with at least one optical inspection target recipe; and storing the at least one optical inspection target recipe including the at least one proxy component in a recipe distribution server. A method may include, but is not limited to: receiving a selection of at least one recipe associated with an optical inspection target to be inspected at a first inspection tool node; and determining whether one or more external recipe components associated with the recipe are stored on at least one of the first inspection tool node and a second node.
Public/Granted literature
- US20120010843A1 IN-PLACE MANAGEMENT OF SEMICONDUCTOR EQUIPMENT RECIPES Public/Granted day:2012-01-12
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