Invention Grant
- Patent Title: Antenna testing device and antenna testing method using the same
- Patent Title (中): 天线测试装置和使用天线的天线测试方法
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Application No.: US12713267Application Date: 2010-02-26
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Publication No.: US08392134B2Publication Date: 2013-03-05
- Inventor: Zhan Li , Ye Xiong , Ge Zhang
- Applicant: Zhan Li , Ye Xiong , Ge Zhang
- Applicant Address: CN Shenzhen HK Kowloon
- Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee Address: CN Shenzhen HK Kowloon
- Agency: Altis Law Group, Inc.
- Priority: CN200910305458 20090810
- Main IPC: G01R23/16
- IPC: G01R23/16 ; G01R29/10

Abstract:
An antenna testing device includes an analyzer, a transmission probe electrically connected to the analyzer, a receiving probe electrically connected to the analyzer, and a shielded box having a cutoff frequency. The analyzer generates a test signal the frequency of which is lower than the cutoff frequency, the transmission probe receive the test signal and sends the test signal to the shielded box. The antenna is coupled with the transmission probe and generates a coupled signal, the receiving probe receives the coupled signal and sends the coupled signal to the analyzer. The analyzer analyzes the coupled signal and the test signal, the analyzer calculates the return loss of the antenna.
Public/Granted literature
- US20110032162A1 ANTENNA TESTING DEVICE AND ANTENNA TESTING METHOD USING THE SAME Public/Granted day:2011-02-10
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